Hitachi‘s HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens. Available through Sigmatech Inc.

The NEXT Generation of Innovation. Meeting and Exceeding Needs and Requirements in Many Fields.
The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high resolution.
This breakthrough in advanced innovative design allows for highly efficient workflows and many specialized applications. It represents the cutting-edge solution for modern TEM analyses.
The Application Data Collection has a “Life Science” section and a “Materials and Semiconductors” section, introducing typical examples of measurements and applications in each field.
Digital functionality from beam adjustments to observation and more
Ability to specify ROI in low-mag image and easily capture at desired magnification
Automated Multi-frame Panoramic function, Drift Correction, Auto Pre-Irradiation, STEM, EDX, various Specimen Holders, and Electron Beam Tomography are available for a wide variety of analysis needs.
“RuliTEM” based on the Revolution of Ultimate Luxury Imaging by Hitachi HT7800 TEM
Taking transmission electron microscopy to new heights of luxury and performance
HT7800 | HT7820 | HT7830 | |
---|---|---|---|
Electron gun | W, LaB6 | ||
Accelerating voltage | 20 – 120 kV (100 V/step variable) | ||
Resolution (Lattice) | 0.20 nm (Off-axis, 100 kV) |
0.14 nm (Off-axis, 120 kV) |
0.14 nm (Off-axis, 120 kV) 0.19 nm (On-axis, 120 kV) |
Maximum magnification | x600,000 | x800,000 | x1,000,000 |
Stage maximum tilt angle | ±70° | ±30° | ±10° |
Standard features | Auto focus, Microtrace, Autodrive, Live FFT display, Measurement function, Low dose, API (auto pre-irradiation), Image navigation function, Column with mild baking function, Whole view function, Drift correction function etc. |
The Application Data Collection has a “Life Science” section and a “Materials and Semiconductors” section, introducing typical examples of measurements and applications in each field.
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