FLAT AND ANGLED PREPARATION OF OPTICAL, ELECTRONIC & MATERIALOGRAPHIC COMPONENTS

ULTRAPOL End & Edge Polisher has been designed to provide accurate lapping and polishing for research and industrial applcations. Several thousand of these units are already assisting users in a wide range of technical disciplines.

FLAT AND ANGLED PREPARATION OF OPTICAL, ELECTRONIC & MATERIALOGRAPHIC COMPONENTS

ULTRAPOL End & Edge Polisher has been designed to provide accurate lapping and polishing for research and industrial applcations. Several thousand of these units are already assisting users in a wide range of technical disciplines.

  • Fully Angle adjustable – produces specific wedge angles
  • Quick Release Interface allow for fast and repeatable mounting and demounting.
  • Holders available for most components
  • Fast process times
  • Low run-out lap for flat optical polishes

The specific workholder for an application is held firmly and repeatably with the system’s quick release interface. Standard holders are available for many applications, including:

  • Capillary / glass ferrule polishing
  • Planar Waveguide polishing
  • Bare fiber polishing – flat and angle polishing
  • Integrated optics
  • Die Cross-sectioning
  • SEM and TEM sample preparation
  • IC Wafer and package-level backside preparation
  • Encapsulated mount polishing

Related Products

The ideal choice for biological and electrochemical studies.
The ideal choice for biological and electrochemical studies.
Industry’s leading automated AFM for high-value wafer metrology solutions
Industry’s leading automated AFM for high-value wafer metrology solutions
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.
Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
Real‑time quantitative imaging for life sciences and materials science
Real‑time quantitative imaging for life sciences and materials science
Accessible nanometrology for academic research
Accessible nanometrology for academic research

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

Ultrapol Advance
Flat Lapping and Polishing Machine
Ultrapol Advance
Flat Lapping and Polishing Machine