The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up. It is ideally suited for mid-volume lab applications where high resolution and data acquisition flexibility are crucial to obtain high quality scanning results. Due to its small dimensions this desktop scanner easily fits in every laboratory environment.

The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up. It is ideally suited for mid-volume lab applications where high resolution and data acquisition flexibility are crucial to obtain high quality scanning results. Due to its small dimensions this desktop scanner easily fits in every laboratory environment.

Insight KK IS-202 Scanning Acoustic Microscope

  • High precision scanning by use of extremely low noise linear servo motor on the scan axis
  • High-speed scanning at up to 500 mm/sec
  • Specific low-vibration data acquisition mode integrated
  • High scan resolution of down to 0.1 µm on all three x-, y-, and z-axis
  • Simultaneous pulse-echo and through transmission acquisition supported
  • Removable water tank for easy cleaning
  • Scan mechanics can be used for other than water immersion techniques
IS-202 Scanning Acoustic Microscope insight kk

Contact us for more information.

Related Products

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces
Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features
PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features
ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.
ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

IS-202
Scanning Acoustic Microscope
IS-202
Scanning Acoustic Microscope