Insight KK IS-350 Scanning Acoustic Microscope
Insight KK IS-202 Scanning Acoustic Microscope
Insight KK IS-202 Scanning Acoustic Microscope Contact us for more information.
Ulvac PHI 710 Auger Electron Spectroscopy (AES, SAM)
SEM resolution ≤ 3 nm, AES resolution ≤ 8 nm In Auger analysis (spectrum, depth profile or mapping), it is necessary to set AES analysis point with SEM image. A fine focused electron beam is required for SEM imaging and an extremely stable electron beam at enough current for AES analysis is required at a […]