Hitachi NEXTA STA Series Simultaneous Thermogravimetric Analyzer (DSC TGA)

Features 1. World class baseline performance The NEXTA STA series incorporates a new balance control technology in addition to the horizontal digital dual beam system that has been well received in our previous models. Conventionally, baseline drift occurs due to hysteresis in the temperature program or surrounding environmental factors. However, by incorporating a new balance […]

Hamamatsu Phemos-X Emission Microscope | Failure Analysis System

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects. Available in Philippines through Sigmatech Inc. Two ultra-high sensitivity cameras are mountable Coverage of different detection wavelength ranges for emission analysis and thermal analysis allows easy selection of an […]

Hitachi TM4000II / TM4000Plus II | Innovative Scanning Electron Microscope Philippines

Tabletop Scanning Electron Microscope Philippines The Hitachi TM4000II and TM4000Plus II Scanning Electron Microscopes (SEM) offer advanced imaging capabilities with user-friendly operation. These tabletop SEMs provide high-resolution images and elemental analysis, making them ideal for research, quality control, and educational applications. Available in the Philippines through Sigmatech Inc. A quality image can be obtained with […]