Seiwa Optical IR-2200 Infrared Microscope

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision. Contact us for more information.

Seiwa Optical Wafer Inspection System

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results. Brochure >

Seiwa Optical Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers.By using On-Fly measurement mode, system perform high speed and high accuracyvisual inspection for such as pattern defects, contamination, cracks.

Quorum K975X Turbo-Pumped Thermal Evaporator

The K975X is a compact, bench-mounted, multiple applicationthermal evaporator for vacuum deposition of thin layers ofcarbon and metals. It is ideal for a wide range of techniques,including the manufacture of carbon support films and replicasfor TEM, plus metal and carbon thin film applications.The K975X is available with a wide range of optional add-ons,including low-angle shadowing […]

ULTRA TEC ASAP-1 Selected Area Sample Preparation System

ULTRA TEC ASAP-1 Selected Area Sample Preparation System In recent years, driven by exponential growth of newer packaging types; CSP, MCM, BGA, flip chip to name a few; in addition to ever more demanding analytical methods, the ASAP® application array has expanded to encompass mechanical decapsulation and topside de-processing. The 2nd Generation ASAP-1® models provide the same elegant […]

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw | LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS & DEVICES ULTRASLICE Macrotome precision diamond saw has a quiet, safe, direct drive design for smooth, chatter free slicing system for important and fragile industrial samples. The system is perfect for the sectioning of cellphone devices and components to allow […]

Hamamatsu iPHEMOS MPX Inverted Emission Microscope – Sigmatech Inc. Philippines

Features Two ultra-high sensitivity cameras are mountable Coverage of different detection wavelength ranges for emission analysis and thermal analysis allows easy selection of an analysis technique that matches the sample and failure mode. Up to 5 light sources for OBIRCH, DALS and EOP are mountable High sensitivity macro lens and up to 10 lenses suitable […]

Hitachi SU8600 Ultra High Resolution Cold-FESEM Philippines

Hitachi SU8600 Ultra High Resolution Cold-FESEM Philippines Features UltraHigh-Resolution Hitachi’s high-brightness cold field emission source provides ultrahigh-resolution images even at Ultra-low voltages. Specimen courtesy of Dr. Yoshihiro Kamimura,National Institute of Advanced Industrial Science andTechnology (AIST), Japan Left: RHO-type Zeolite particle at low-kV. In order to reveal fine steps structure on surface, the image was acquired […]

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failure analysis, material characterization, and metrology equipment

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