Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

Multifunctional Probe Atomic Force Microscope

AFM100

The AFM100 Series is Hitachi’s next generation probe microscopy platform. The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy, while providing an easy-to-use platform suitable for users of all experience levels.
Experience the finest reliability and innovation with the AFM100 Series.

Features

Pre-mounted cantilevers make replacement EASY(option)

Automated measurement & analysis with one-click autopilot function

Correlative SEM-EDS Analysis with our AFM Marking Function

Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!

Automated AFM Marking Features with Navigation Software.

・Automated AFM Marking Features with Navigation Software. — ※SÆMic. is a generic term for SEM-AFM correlative analysis recommended by Hitachi High-Tech.

[Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after Corrosion]

Specifications

AFM100 Plus/AFM100 System Specifications
	AFM100 Plus	AFM100
Detection System/Light Source	Optical lever/SLD (Super luminescent diode)
Lever holder	Premount holder^, multi-holder^
Basic Specifications	RMS noise level: ≦0.03 nm, in-plane drift: ≦0.03 nm/sec
Sample size	Max. 35 mmφ, thickness 10 mm, (max. 50 mm sq., thickness 20 mm)^*
Scanner (Scan range)^*	(XY:20 μm/Z:1.5 μm, XY:100 μm/Z:15 μm, XY:150 μm/Z:5 μm)^*(Included with a 5-year warranty)
Light microscope	Microscope with zoom function (Field of view XY:1.8 x 1.38 to 0.26 x 0.2 mm)^* Simple optical microscope (Field of view XY:1.6 x 1.2 mm)^*	Simple optical microscope (field of view XY:1.6 × 1.2 mm)
Basic functions	AFM, DFM, PM, FFM, SIS-shapes/properties, Q-value control	AFM, DFM, PM, FFM, SIS-shapes
Vibration isolation and noise isolation mechanism	Passive vibration isolation air table and sound-proof cover	Standard tabletop
Sample transfer mechanism	Manual Stage XY:±2.5 mm, Impact Stage Set (Conductive Type)^*
Measurement environment	Atmosphere, in liquid^, heated^ (room temperature to 250 °C), heated in liquid^* (room temperature to 60 °C)
Other functions	Self-check function, software download service, AFM marking^*
Power Supply Specifications	AC 100 V ± 10 V, 15 A, 1 line, D inoculated grounded receptacle

※The asterisk (*) in the table indicates feature is optional.

※For detailed specifications, please refer to the product specification sheet.

Downloads

See more on Hitachi’s website

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

iPHEMOS MPX

Inverted Emission Microscope

The iPHEMOS-MPX is a high-resolution Inverted Emission Microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

SU8600

Ultra High Resolution Cold-FESEM

The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.

K850

Critical Point Dryer

The K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control.

SU3800 / SU3900

Scanning Electron Microscope

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.

NEXTA DMA

Dynamic Mechanical Analyzer

Hitachi’s DMA is the perfect tool for assessing both stiff and soft samples, while also capturing rapid modulus changes.

Ultrapol Advance

Flat Lapping and Polishing Machine

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.

nanoTOF II

Time-of-flight Secondary Ion Mass Spectroscope (TOF-SIMS)

PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features

IM4000Plus

Ion Milling System

The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling.

Multifunctional Probe Atomic Force Microscope

AFM100

Pre-mounted cantilevers make replacement EASY(option)

Automated measurement & analysis with one-click autopilot function

Correlative SEM-EDS Analysis with our AFM Marking Function

Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!

[Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after Corrosion]

Specifications

Related Products

How can we help?

Download catalog

Subscribe to newsletter

Inquire About this Product