Park NX7 is a compact atomic force microscope (AFM) designed for accessible nanoscale research. Its table-top format makes it especially suitable for educational environments and
How Atomic Force Microscopy (AFM) Works Atomic Force Microscopy, commonly known as AFM, is a nanoscale imaging and measurement technique used to examine surfaces in
Park NX-PTR is an AFM system designed specifically for pole tip recess (PTR) metrology of HDD heads in manufacturing environments. Two custom sample holders for
Park NX-HDM is a leading-edge atomic force microscope (AFM) purpose-built for semiconductor R&D, FA, and QA laboratories, supporting wafers up to 150 mm. Leveraging Park
Park nano-IR spectrometers seamlessly integrate atomic force microscopy (AFM) with photo-induced force microscopy (PiFM) technology. These innovative platforms deliver molecular vibration mapping at the nanometer
NX-Hivac is a high-vacuum atomic force microscope (AFM) engineered for advanced semiconductor and materials research, enabling precise nanoscale analysis of air-sensitive samples. By providing clean
Park NX15 is a versatile atomic force microscope (AFM) engineered for dependable performance. Its sample stage accommodates full coverage of wafers up to 150 mm,
NX12 is a specialized atomic force microscope (AFM) for materials science, electrochemical, and biochemical research. It delivers nanoscale imaging and property characterization in both liquid
Park NX20 is a flagship atomic force microscope (AFM) designed for large-sample research, delivering unmatched accuracy, reliability, and ease of use. As Park Systems’ original
Park NX1 is a compact AFM designed for high-resolution imaging with stable operation. The system combines a mechanically rigid structure with a thermally stable body
Park NX7 is a compact atomic force microscope (AFM) designed for accessible nanoscale research. Its table-top format makes it especially suitable for educational environments and
How Atomic Force Microscopy (AFM) Works Atomic Force Microscopy, commonly known as AFM, is a nanoscale imaging and measurement technique used to examine surfaces in
Park NX-PTR is an AFM system designed specifically for pole tip recess (PTR) metrology of HDD heads in manufacturing environments. Two custom sample holders for
Park NX-HDM is a leading-edge atomic force microscope (AFM) purpose-built for semiconductor R&D, FA, and QA laboratories, supporting wafers up to 150 mm. Leveraging Park
Park nano-IR spectrometers seamlessly integrate atomic force microscopy (AFM) with photo-induced force microscopy (PiFM) technology. These innovative platforms deliver molecular vibration mapping at the nanometer
NX-Hivac is a high-vacuum atomic force microscope (AFM) engineered for advanced semiconductor and materials research, enabling precise nanoscale analysis of air-sensitive samples. By providing clean
Park NX15 is a versatile atomic force microscope (AFM) engineered for dependable performance. Its sample stage accommodates full coverage of wafers up to 150 mm,
NX12 is a specialized atomic force microscope (AFM) for materials science, electrochemical, and biochemical research. It delivers nanoscale imaging and property characterization in both liquid
Park NX20 is a flagship atomic force microscope (AFM) designed for large-sample research, delivering unmatched accuracy, reliability, and ease of use. As Park Systems’ original
Park NX1 is a compact AFM designed for high-resolution imaging with stable operation. The system combines a mechanically rigid structure with a thermally stable body
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