Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform Pre-mounted cantilevers make replacement EASY(option) Automated measurement & analysis with one-click autopilot function Correlative SEM-EDS Analysis with our AFM Marking Function Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results! [Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after […]

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failure analysis, material characterization, and metrology equipment

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