X-ray Fluorescence Analyzer (XRF)

MESA-50

HORIBA MESA-50 Series is a portable benchtop energy dispersive X-ray fluorescence (EDXRF) analyzer with ultimate user-friendly operation. It achieves a super compact footprint without compromising X-ray safety thanks to the X-ray shields compliant with IEC 61010-1/JAIMAS 0101-2001.

  • Powerful HardwareAchieving the energy-efficient and compact optical design, the MESA-50 features a high-performance Silicon Drift Detector (SDD) for more excellent sensitivity and performance comparable to conventional benchtop EDXRF analyzers. It works without the need of vacuum pump and reduces running costs.
    • Powerful X-ray generator: Up to 50 kV, 200 μA, 10 W with Pd target
    • Multiple Primary X-ray filters: Enhance S/N by cutting off background
    • Switchable multi-collimators: Selectable down to 1.2 mm up to 7 mm
    • Silicon drift detector: Achieve high performance without liquid nitrogen
      MESA-50 hardware (left) and the optic design diagram (right) Simple Operation
    1. Set the sample on the measurement window of MESA-50
    2. Press “Measurement Start” button in the software
    3. While the measurement, the red X-RAY ON lamp turns on
    4. The measurement results are shown in the software
    5. Report function: The result can be output in Microsoft Excel(R), Word(R) or PDF formats
    We have a variety of sample cells available to choose from for your liquid samples. Please refer how to choose and assemble the sample cells for your reference.Play Video Optional Software Modules
    1. RoHS module
      The RoHS module allows user to perform RoHS screening analysis and halogen screening analysis by just one click a button. The module offers built in workflow which enables automatic sequential measurement without special skill and knowledge of user.
    2. As/Sb module
      The As/Sb module is an additional module to the RoHS module. The module can determine As and Sb concentration using the built in parameters. The module can export a report which include the result of As and Sb.
    3. Multilayer FPM module
      The multilayer FPM module is an optional software for thickness calculation. The software calculates the layer thickness of a multilayer sample using user defined layer modeling. It allows users to get layer thickness result even without standard samples.
    *MESA-50 software can calculate thickness without the optional software module if it is based on calibration curve method. Wide Range Applications
    • Electronics: RoHS screening analysis (IEC 62321-3-1:2013, ASTM F2617-15)
    • Metals: Steel plating thickness analysisPlating solution analysis; Precious metal plating analysis.
    • Energy: Material characterization; Pt loading mass determination of fuel cell
    • Enviroment : Hazardous elements in Soil
    • Pharmasecutical: Defect analysis; Hazardous elements in Cosmetics
    • Food : Defect analysis; Chlorine detemination in soy source
    • Metal:Material screening identification
    • Material: Harzardous elements in Toys
    • Forensic: On-site trace evidence identification
    • Educational purpose: Scientific class in schools.
 
Layer thickness and elemental composition determination of metallic coatings: the power of GD-OES & DiP and EDXRF
Features
  • Powerful Hardware

    Achieving the energy-efficient and compact optical design, the MESA-50 features a high-performance Silicon Drift Detector (SDD) for more excellent sensitivity and performance comparable to conventional benchtop EDXRF analyzers. It works without the need of vacuum pump and reduces running costs.

    • Powerful X-ray generator: Up to 50 kV, 200 μA, 10 W with Pd target
    • Multiple Primary X-ray filters: Enhance S/N by cutting off background
    • Switchable multi-collimators: Selectable down to 1.2 mm up to 7 mm
    • Silicon drift detector: Achieve high performance without liquid nitrogen

     

     

    MESA-50 hardware (left) and the optic design diagram (right)

     


    Simple Operation

    1. Set the sample on the measurement window of MESA-50
    2. Press “Measurement Start” button in the software
    3. While the measurement, the red X-RAY ON lamp turns on
    4. The measurement results are shown in the software
    5. Report function: The result can be output in Microsoft Excel(R), Word(R) or PDF formats

    We have a variety of sample cells available to choose from for your liquid samples. Please refer how to choose and assemble the sample cells for your reference.

     
     

     


    Optional Software Modules

    1. RoHS module
      The RoHS module allows user to perform RoHS screening analysis and halogen screening analysis by just one click a button. The module offers built in workflow which enables automatic sequential measurement without special skill and knowledge of user.
    2. As/Sb module
      The As/Sb module is an additional module to the RoHS module. The module can determine As and Sb concentration using the built in parameters. The module can export a report which include the result of As and Sb.
    3. Multilayer FPM module
      The multilayer FPM module is an optional software for thickness calculation. The software calculates the layer thickness of a multilayer sample using user defined layer modeling. It allows users to get layer thickness result even without standard samples.

    *MESA-50 software can calculate thickness without the optional software module if it is based on calibration curve method.

     


    Wide Range Applications

    • Electronics: RoHS screening analysis (IEC 62321-3-1:2013, ASTM F2617-15)
    • Metals: Steel plating thickness analysisPlating solution analysis; Precious metal plating analysis.
    • Energy: Material characterization; Pt loading mass determination of fuel cell
    • Enviroment : Hazardous elements in Soil
    • Pharmasecutical: Defect analysis; Hazardous elements in Cosmetics
    • Food : Defect analysis; Chlorine detemination in soy source
    • Metal:Material screening identification
    • Material: Harzardous elements in Toys
    • Forensic: On-site trace evidence identification
    • Educational purpose: Scientific class in schools.

 
Layer thickness and elemental composition determination of metallic coatings: the power of GD-OES & DiP and EDXRF

Related Products

The EMIA-Pro Carbon/Sulfur Analyzer provides exceptional accuracy, streamlined maintenance and user-friendly software enhancements that enable efficient measurements.
The LA-960 combines the most popular modern sizing technique with state of the art refinements to measure wet and dry samples measuring 10 nanometers to 5 millimeters.
The LA-960 combines the most popular modern sizing technique with state of the art refinements to measure wet and dry samples measuring 10 nanometers to 5 millimeters.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
The Excite Pharos is a compact, user-friendly femtosecond laser ablation system with a fully sealed, factory-aligned laser head requiring no routine adjustments or cleaning.
The ASX-560 four-rack autosampler is a compact and efficient solution for medium- to high-volume sample applications, capable of holding up to 360 samples.

VOC

The Teledyne Tekmar U-shaped trap offers trapping benefits that have never been seen before by Purge and Trap concentrators.
Standard torch dimensions (20 mm) with 1.5 mm injector (2.5 mm injector option) designed around the fixed position torch holder assembly.
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method.
The QuickTrace® M-7600 delivers ultra-trace mercury detection (<0.5 ng/L) for water, soil, and biological samples.

How can we help?

You may contact our specialists by accomplishing form below.

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

MESA-50
X-ray Fluorescence Analyzer (XRF)
MESA-50
X-ray Fluorescence Analyzer (XRF)