- Powerful HardwareAchieving the energy-efficient and compact optical design, the MESA-50 features a high-performance Silicon Drift Detector (SDD) for more excellent sensitivity and performance comparable to conventional benchtop EDXRF analyzers. It works without the need of vacuum pump and reduces running costs.
- Powerful X-ray generator: Up to 50 kV, 200 μA, 10 W with Pd target
- Multiple Primary X-ray filters: Enhance S/N by cutting off background
- Switchable multi-collimators: Selectable down to 1.2 mm up to 7 mm
- Silicon drift detector: Achieve high performance without liquid nitrogen
MESA-50 hardware (left) and the optic design diagram (right) Simple Operation- Set the sample on the measurement window of MESA-50
- Press “Measurement Start” button in the software
- While the measurement, the red X-RAY ON lamp turns on
- The measurement results are shown in the software
- Report function: The result can be output in Microsoft Excel(R), Word(R) or PDF formats
- RoHS module
The RoHS module allows user to perform RoHS screening analysis and halogen screening analysis by just one click a button. The module offers built in workflow which enables automatic sequential measurement without special skill and knowledge of user. - As/Sb module
The As/Sb module is an additional module to the RoHS module. The module can determine As and Sb concentration using the built in parameters. The module can export a report which include the result of As and Sb. - Multilayer FPM module
The multilayer FPM module is an optional software for thickness calculation. The software calculates the layer thickness of a multilayer sample using user defined layer modeling. It allows users to get layer thickness result even without standard samples.
- Electronics: RoHS screening analysis (IEC 62321-3-1:2013, ASTM F2617-15)
- Metals: Steel plating thickness analysis; Plating solution analysis; Precious metal plating analysis.
- Energy: Material characterization; Pt loading mass determination of fuel cell
- Enviroment : Hazardous elements in Soil
- Pharmasecutical: Defect analysis; Hazardous elements in Cosmetics
- Food : Defect analysis; Chlorine detemination in soy source
- Metal：Material screening identification
- Material: Harzardous elements in Toys
- Forensic: On-site trace evidence identification
- Educational purpose: Scientific class in schools.
MESA-50 hardware (left) and the optic design diagram (right) Simple Operation
