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Failure Analysis,
Material Characterization
and Metrology Equipment

Scanning Electron Microscopes, Transmission Electron Microscopes, Atomic Force Microscopes, Raman Microscopes, Thermal Analyzers, FTIR, Failure Analysis Systems, Sample Preparation Equipment, Scanning Acoustic Microscopes, Optical Microscopes, X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and more.

Failure Analysis, Material Characterization and Metrology Equipment

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Radio Filter Failure Analysis
Tabletop Scanning Electron Microscope Philippines
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1

TM4000 Plus

TM4000 Plus

Tabletop Scanning Electron Microscope

Tabletop Scanning Electron Microscope

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
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Emission Microscope
2
2

Phemos-X

Phemos-X

Emission microscope

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
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Hitachi NEXTA STA Simultaneous thermogravimetric analyzer
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1

NEXTA STA Series

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
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Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform
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1

AFM100

AFM100

Multifunctional Probe Atomic Force Microscope

Multifunctional Probe Atomic Force Microscope

The AFM100 Series is Hitachi’s next generation probe microscopy platform.
The AFM100 Series is Hitachi’s next generation probe microscopy platform.
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ArBlade 5000 Ion Milling System
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1

ArBlade 5000

ArBlade 5000

Ion Milling System

Ion Milling System

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.
The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.
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HITACHI IM4000 Ion Milling System
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1

IM4000Plus

IM4000Plus

Ion Milling System

Ion Milling System

The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling.
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling.
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1
1

MC1000

MC1000

Ion Sputter Coater

Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-
The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-
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su3900 Scanning Electron Microscope
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1

SU3800 / SU3900

SU3800 / SU3900

Scanning Electron Microscope

Scanning Electron Microscope

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.
Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.
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Focused Ion and Electron Beam System Ethos NX5000 Series FIB-SEM
1
1

NX5000

NX5000

Focused Ion and Electron Beam System

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.
Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.
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1
1

SU8600

SU8600

Ultra High Resolution Cold-FESEM

Ultra High Resolution Cold-FESEM

The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.
The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.
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1
1

NEXTA DSC

NEXTA DSC

Differential Scanning Calorimeter

Differential Scanning Calorimeter

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
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Hitachi SU9000 Scanning Electron Microscope SEM
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1

SU9000

SU9000

Ultra-high Resolution Scanning Electron Microscope

Ultra-high Resolution Scanning Electron Microscope

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright
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failure analysis, material characterization, and metrology equipment

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