The Accurion RSE (Referenced Spectroscopic Ellipsometer) is a high-speed ellipsometry system designed for rapid, large-area thickness mapping of thin films and surfaces. By directly comparing
Accurion SIMON is a compact entry-level system for Imaging Ellipsometry, specifically designed for routine measurement and inspection tasks. Based on a fixed-angle ellipsometer design, SIMON
Accurion EP4 is a high-end system for Imaging Spectroscopic Ellipsometry, combining spectroscopic ellipsometry and optical microscopy in a single instrument. It enables spatially resolved, parallel
The Accurion RSE (Referenced Spectroscopic Ellipsometer) is a high-speed ellipsometry system designed for rapid, large-area thickness mapping of thin films and surfaces. By directly comparing
Accurion SIMON is a compact entry-level system for Imaging Ellipsometry, specifically designed for routine measurement and inspection tasks. Based on a fixed-angle ellipsometer design, SIMON
Accurion EP4 is a high-end system for Imaging Spectroscopic Ellipsometry, combining spectroscopic ellipsometry and optical microscopy in a single instrument. It enables spatially resolved, parallel
Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.
