Infrared Microscope Philippines – Seiwa Optical IR-2200 Infrared Microscope

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision. The IR-2200 Infrared Microscope system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera. Capable of high precision measurements, image capture, verification […]

Seiwa Optical Wafer Inspection System

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results. Brochure >

Seiwa Optical Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers.By using On-Fly measurement mode, system perform high speed and high accuracyvisual inspection for such as pattern defects, contamination, cracks.