ULVAC PHI nanoTOF 3+ Time-of-Flight Secondary Ion Mass Spectrometry

ULVAC PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features KEY TECHNOLOGY Triple Focusing Electrostatic Analyzerfor Complex Sample Geometries TRIFT Analyzer for a Wide Range of Sample Geometries,Wide Bandpass Energy, and Wide Acquisition Angle In exactly the same mass will have different flight times in the analyzer. This is […]

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failure analysis, material characterization, and metrology equipment

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