Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

The AFM100 Series is Hitachi’s next generation probe microscopy platform. The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy, while providing an easy-to-use platform suitable for users of all experience levels.
Experience the finest reliability and innovation with the AFM100 Series.

Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

Pre-mounted cantilevers make replacement EASY(option)

Automated measurement & analysis with one-click autopilot function

Correlative SEM-EDS Analysis with our AFM Marking Function

Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!

Automated AFM Marking Features with Navigation Software.

・Automated AFM Marking Features with Navigation Software. — ※SÆMic. is a generic term for SEM-AFM correlative analysis recommended by Hitachi High-Tech.

[Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after Corrosion]

Specifications

	AFM100 Plus	AFM100
Detection System/Light Source	Optical lever/SLD (Super luminescent diode)
Lever holder	Premount holder^, multi-holder^
Basic Specifications	RMS noise level: ≦0.03 nm, in-plane drift: ≦0.03 nm/sec
Sample size	Max. 35 mmφ, thickness 10 mm, (max. 50 mm sq., thickness 20 mm)^*
Scanner (Scan range)^*	(XY:20 μm/Z:1.5 μm, XY:100 μm/Z:15 μm, XY:150 μm/Z:5 μm)^*(Included with a 5-year warranty)
Light microscope	Microscope with zoom function (Field of view XY:1.8 x 1.38 to 0.26 x 0.2 mm)^* Simple optical microscope (Field of view XY:1.6 x 1.2 mm)^*	Simple optical microscope (field of view XY:1.6 × 1.2 mm)
Basic functions	AFM, DFM, PM, FFM, SIS-shapes/properties, Q-value control	AFM, DFM, PM, FFM, SIS-shapes
Vibration isolation and noise isolation mechanism	Passive vibration isolation air table and sound-proof cover	Standard tabletop
Sample transfer mechanism	Manual Stage XY:±2.5 mm, Impact Stage Set (Conductive Type)^*
Measurement environment	Atmosphere, in liquid^, heated^ (room temperature to 250 °C), heated in liquid^* (room temperature to 60 °C)
Other functions	Self-check function, software download service, AFM marking^*
Power Supply Specifications	AC 100 V ± 10 V, 15 A, 1 line, D inoculated grounded receptacle

※The asterisk (*) in the table indicates feature is optional.

※For detailed specifications, please refer to the product specification sheet.

Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

For more information, contact us. See more on Hitachi’s website

Features

Pre-mounted cantilevers make replacement EASY(option)

Automated measurement & analysis with one-click autopilot function

Correlative SEM-EDS Analysis with our AFM Marking Function

Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!

Automated AFM Marking Features with Navigation Software.

[Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after Corrosion]

Specifications

AFM100 Plus/AFM100 System Specifications
	AFM100 Plus	AFM100
Detection System/Light Source	Optical lever/SLD (Super luminescent diode)
Lever holder	Premount holder^, multi-holder^
Basic Specifications	RMS noise level: ≦0.03 nm, in-plane drift: ≦0.03 nm/sec
Sample size	Max. 35 mmφ, thickness 10 mm, (max. 50 mm sq., thickness 20 mm)^*
Scanner (Scan range)^*	(XY:20 μm/Z:1.5 μm, XY:100 μm/Z:15 μm, XY:150 μm/Z:5 μm)^*(Included with a 5-year warranty)
Light microscope	Microscope with zoom function (Field of view XY:1.8 x 1.38 to 0.26 x 0.2 mm)^* Simple optical microscope (Field of view XY:1.6 x 1.2 mm)^*	Simple optical microscope (field of view XY:1.6 × 1.2 mm)
Basic functions	AFM, DFM, PM, FFM, SIS-shapes/properties, Q-value control	AFM, DFM, PM, FFM, SIS-shapes
Vibration isolation and noise isolation mechanism	Passive vibration isolation air table and sound-proof cover	Standard tabletop
Sample transfer mechanism	Manual Stage XY:±2.5 mm, Impact Stage Set (Conductive Type)^*
Measurement environment	Atmosphere, in liquid^, heated^ (room temperature to 250 °C), heated in liquid^* (room temperature to 60 °C)
Other functions	Self-check function, software download service, AFM marking^*
Power Supply Specifications	AC 100 V ± 10 V, 15 A, 1 line, D inoculated grounded receptacle

※The asterisk (*) in the table indicates feature is optional.

※For detailed specifications, please refer to the product specification sheet.

Downloads

See more on Hitachi’s website

Ion Milling System

The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling.

Metal/Carbon Sputtering

With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum coaters are suitable for applications, including high-resolution SEM and FIB-SEM, ensuring precise resu

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

K975X

Turbo-Pumped Thermal Evaporator

The Quorum K975X Turbo-Pumped Thermal Evaporator is a high vacuum evaporator for TEM, SEM and thin film applications.

ULTRAPOL Basic

Manual Lapping & Polishing Machine

ULTRAPOL Basic lapping and polishing machine offers the build-quality required for high precision manual polishing of materials for production, research and NAND flash chip-off in digital forensics

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.

Phemos-X

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

Ultraslice Macrotome

Precision Diamond Saw

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

Scanning Electron Microscope

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

Ultrapol Advance

Flat Lapping and Polishing Machine

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.

How can we help?

You may contact our specialists by accomplishing form below.

Subscribe to newsletter

First Name

Last Name

Company

Designation

Industry / Market

Inquire for this Product

AFM100

Multifunctional Probe Atomic Force Microscope

AFM100

Multifunctional Probe Atomic Force Microscope

Multifunctional Probe Atomic Force Microscope

AFM100

Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

Pre-mounted cantilevers make replacement EASY(option)

Automated measurement & analysis with one-click autopilot function

Correlative SEM-EDS Analysis with our AFM Marking Function

Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!

[Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after Corrosion]

Specifications

Pre-mounted cantilevers make replacement EASY(option)

Automated measurement & analysis with one-click autopilot function

Correlative SEM-EDS Analysis with our AFM Marking Function

Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!

[Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after Corrosion]

Specifications

Related Products

IM4000Plus

Ion Milling System

Q150

Metal/Carbon Sputtering

MC1000

Ion Sputter Coater

K975X

Turbo-Pumped Thermal Evaporator

ULTRAPOL Basic

Manual Lapping & Polishing Machine

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

Phemos-X

Emission microscope

Ultraslice Macrotome

Precision Diamond Saw

Scanning Electron Microscope

FlexSEM 1000 II

Ultrapol Advance

Flat Lapping and Polishing Machine