Horiba MESA-50 X-ray Fluorescence Analyzer (XRF)

X-ray Fluorescence Analyzer (XRF)

MESA-50

HORIBA MESA-50 Series is a portable benchtop energy dispersive X-ray fluorescence (EDXRF) analyzer with ultimate user-friendly operation. It achieves a super compact footprint without compromising X-ray safety thanks to the X-ray shields compliant with IEC 61010-1/JAIMAS 0101-2001.

Powerful HardwareAchieving the energy-efficient and compact optical design, the MESA-50 features a high-performance Silicon Drift Detector (SDD) for more excellent sensitivity and performance comparable to conventional benchtop EDXRF analyzers. It works without the need of vacuum pump and reduces running costs.
- Powerful X-ray generator: Up to 50 kV, 200 μA, 10 W with Pd target
- Multiple Primary X-ray filters: Enhance S/N by cutting off background
- Switchable multi-collimators: Selectable down to 1.2 mm up to 7 mm
- Silicon drift detector: Achieve high performance without liquid nitrogen
MESA-50 hardware (left) and the optic design diagram (right) Simple Operation
1. Set the sample on the measurement window of MESA-50
2. Press “Measurement Start” button in the software
3. While the measurement, the red X-RAY ON lamp turns on
4. The measurement results are shown in the software
5. Report function: The result can be output in Microsoft Excel(R), Word(R) or PDF formats
We have a variety of sample cells available to choose from for your liquid samples. Please refer how to choose and assemble the sample cells for your reference.Play Video Optional Software Modules
1. RoHS module
  The RoHS module allows user to perform RoHS screening analysis and halogen screening analysis by just one click a button. The module offers built in workflow which enables automatic sequential measurement without special skill and knowledge of user.
2. As/Sb module
  The As/Sb module is an additional module to the RoHS module. The module can determine As and Sb concentration using the built in parameters. The module can export a report which include the result of As and Sb.
3. Multilayer FPM module
  The multilayer FPM module is an optional software for thickness calculation. The software calculates the layer thickness of a multilayer sample using user defined layer modeling. It allows users to get layer thickness result even without standard samples.
*MESA-50 software can calculate thickness without the optional software module if it is based on calibration curve method. Wide Range Applications
- Electronics: RoHS screening analysis (IEC 62321-3-1:2013, ASTM F2617-15)
- Metals: Steel plating thickness analysis; Plating solution analysis; Precious metal plating analysis.
- Energy: Material characterization; Pt loading mass determination of fuel cell
- Enviroment : Hazardous elements in Soil
- Pharmasecutical: Defect analysis; Hazardous elements in Cosmetics
- Food : Defect analysis; Chlorine detemination in soy source
- Metal：Material screening identification
- Material: Harzardous elements in Toys
- Forensic: On-site trace evidence identification
- Educational purpose: Scientific class in schools.

MESA-50 catalog

How to quantify GDOES depth profile data using XRF

Layer thickness and elemental composition determination of metallic coatings: the power of GD-OES & DiP and EDXRF

Features

Powerful Hardware

Achieving the energy-efficient and compact optical design, the MESA-50 features a high-performance Silicon Drift Detector (SDD) for more excellent sensitivity and performance comparable to conventional benchtop EDXRF analyzers. It works without the need of vacuum pump and reduces running costs.
- Powerful X-ray generator: Up to 50 kV, 200 μA, 10 W with Pd target
- Multiple Primary X-ray filters: Enhance S/N by cutting off background
- Switchable multi-collimators: Selectable down to 1.2 mm up to 7 mm
- Silicon drift detector: Achieve high performance without liquid nitrogen
MESA-50 hardware (left) and the optic design diagram (right)

Simple Operation
1. Set the sample on the measurement window of MESA-50
2. Press “Measurement Start” button in the software
3. While the measurement, the red X-RAY ON lamp turns on
4. The measurement results are shown in the software
5. Report function: The result can be output in Microsoft Excel(R), Word(R) or PDF formats
We have a variety of sample cells available to choose from for your liquid samples. Please refer how to choose and assemble the sample cells for your reference.

Optional Software Modules
1. RoHS module
  The RoHS module allows user to perform RoHS screening analysis and halogen screening analysis by just one click a button. The module offers built in workflow which enables automatic sequential measurement without special skill and knowledge of user.
2. As/Sb module
  The As/Sb module is an additional module to the RoHS module. The module can determine As and Sb concentration using the built in parameters. The module can export a report which include the result of As and Sb.
3. Multilayer FPM module
  The multilayer FPM module is an optional software for thickness calculation. The software calculates the layer thickness of a multilayer sample using user defined layer modeling. It allows users to get layer thickness result even without standard samples.
*MESA-50 software can calculate thickness without the optional software module if it is based on calibration curve method.

Wide Range Applications
- Electronics: RoHS screening analysis (IEC 62321-3-1:2013, ASTM F2617-15)
- Metals: Steel plating thickness analysis; Plating solution analysis; Precious metal plating analysis.
- Energy: Material characterization; Pt loading mass determination of fuel cell
- Enviroment : Hazardous elements in Soil
- Pharmasecutical: Defect analysis; Hazardous elements in Cosmetics
- Food : Defect analysis; Chlorine detemination in soy source
- Metal：Material screening identification
- Material: Harzardous elements in Toys
- Forensic: On-site trace evidence identification
- Educational purpose: Scientific class in schools.

Downloads

MESA-50 catalog

How to quantify GDOES depth profile data using XRF

Layer thickness and elemental composition determination of metallic coatings: the power of GD-OES & DiP and EDXRF

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