Quorum Technologies offers advanced sputter and carbon coaters designed to deliver uniform, high-quality coatings essential for optimal electron microscopy performance. These coaters are suitable for a range of applications, including high-resolution SEM and FIB-SEM, ensuring precise and reliable results. With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum's coaters provide versatility and efficiency for researchers and professionals in the field.

Quorum Technologies offers advanced sputter and carbon coaters designed to deliver uniform, high-quality coatings essential for optimal electron microscopy performance. These coaters are suitable for a range of applications, including high-resolution SEM and FIB-SEM, ensuring precise and reliable results. With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum’s coaters provide versatility and efficiency for researchers and professionals in the field.

More info at https://www.quorumtech.com/products/sputter-carbon-coaters

Related Products

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
The iPHEMOS-MPX is a high-resolution Inverted Emission Microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.
ASAP-1® has become the standard preparation equipment that engineers involved in disciplines such as failure analysis, yield enhancement and competitive analysis.
The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.
IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.
STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-
Solution for the review of defects of semiconductor integrated circuit detected by AOI/AVI at front end processing, helps to eliminate false defects and increase overall yield.

How can we help?

You may contact our specialists by accomplishing form below.

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

Q150
Metal/Carbon Sputtering
Q150
Metal/Carbon Sputtering