Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Infrared Microscope

IR-2200

The IR-2200 Infrared Microscope system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.

Capable of high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.

The IR-2200 Infrared Microscope system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.

Capable of high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.

Add to Quote List

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

Contact us for more information.

IR-2200

Related Products

MC1000

MC1000

Ion Sputter Coater

Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

ASAP-1

ASAP-1

Selected Area Preparation System

Selected Area Preparation System

ASAP-1® has become the standard preparation equipment that engineers involved in disciplines such as failure analysis, yield enhancement and competitive analysis.

ASAP-1® has become the standard preparation equipment that engineers involved in disciplines such as failure analysis, yield enhancement and competitive analysis.

NEXTA DSC

NEXTA DSC

Differential Scanning Calorimeter

Differential Scanning Calorimeter

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

PHI 710

PHI 710

Auger Electron Spectroscopy (AES, SAM)

Auger Electron Spectroscopy (AES, SAM)

The only scanning Auger nanoprobe in the world that guarantees a field emission electron source whose spatial resolution is 8 nm or less.

The only scanning Auger nanoprobe in the world that guarantees a field emission electron source whose spatial resolution is 8 nm or less.

K975X

K975X

Turbo-Pumped Thermal Evaporator

Turbo-Pumped Thermal Evaporator

The Quorum K975X Turbo-Pumped Thermal Evaporator is a high vacuum evaporator for TEM, SEM and thin film applications.

The Quorum K975X Turbo-Pumped Thermal Evaporator is a high vacuum evaporator for TEM, SEM and thin film applications.

NEXTA DMA

NEXTA DMA

Dynamic Mechanical Analyzer

Dynamic Mechanical Analyzer

Hitachi’s DMA is the perfect tool for assessing both stiff and soft samples, while also capturing rapid modulus changes.

Hitachi’s DMA is the perfect tool for assessing both stiff and soft samples, while also capturing rapid modulus changes.

SU9000

SU9000

Ultra-high Resolution Scanning Electron Microscope

Ultra-high Resolution Scanning Electron Microscope

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright

TM4000 Plus

TM4000 Plus

Tabletop Scanning Electron Microscope

Tabletop Scanning Electron Microscope

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design