Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Infrared Microscope

IR-2200

The IR-2200 Infrared Microscope system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.

Capable of high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.

The IR-2200 Infrared Microscope system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.

Capable of high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.

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IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

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IR-2200

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Q150

Q150

Metal/Carbon Sputtering

Metal/Carbon Sputtering

With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum coaters are suitable for applications, including high-resolution SEM and FIB-SEM, ensuring precise resu

With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum coaters are suitable for applications, including high-resolution SEM and FIB-SEM, ensuring precise resu

Wafer Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

NEXTA DSC

NEXTA DSC

Differential Scanning Calorimeter

Differential Scanning Calorimeter

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

NEXTA STA Series

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.

STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.

IS-202

IS-202

Scanning Acoustic Microscope

Scanning Acoustic Microscope

The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up.

The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up.

ArBlade 5000

ArBlade 5000

Ion Milling System

Ion Milling System

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.

ZONESEMⅡ

ZONESEMⅡ

Sample Cleaner

Sample Cleaner

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

SU3800 / SU3900

SU3800 / SU3900

Scanning Electron Microscope

Scanning Electron Microscope

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.