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Seiwa
Failure Analysis, Material Characterization, Metrology Equipment
Semiconductor Inspection System

Infrared Microscope

IR-2200

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The IR-2200 Infrared Microscope system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.

Capable of high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.

Key Industries: Chemicals, Lenses, Semiconductor and Electronics and more.
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IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

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IR-2200 

Features

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

More information available upon request.

IR-2200 

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IR-2200
Infrared Microscope
IR-2200
Infrared Microscope