Hitachi Scanning Electron Microscope FlexSEM 1000 II

The Hitachi FlexSEM 1000 II Scanning Electron Microscope is a cutting-edge instrument designed for high-resolution imaging and analytical performance. With its compact, lab-friendly design, it features advanced electron optics and signal detection systems, achieving a resolution of 4.0 nm. Ideal for both novice and expert users, the FlexSEM 1000 II offers intuitive operation and versatile applications, making […]

Hitachi SEM SU7000 Scanning Electron Microscope

SU7000: The Next-Generation FE-SEM The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.The SU7000 is designed to address these aspects and more by delivering enhanced information for diversified needs in the field of […]

Hitachi SU9000 Scanning Electron Microscope

Hitachi SU9000 Scanning Electron Microscope Overview The SU9000II is HITACHI’s new premium SEM. It features unique electron optics, with the sample positioned inside a gap between the upper and lower parts of the objective lens pole piece. This so-called true in-lens concept – combined with the next generation of HITACHI’s cold field emission technology – […]

Hitachi SU8600 Ultra High Resolution Cold-FESEM Philippines

Hitachi SU8600 Ultra High Resolution Cold-FESEM Philippines Features UltraHigh-Resolution Hitachi’s high-brightness cold field emission source provides ultrahigh-resolution images even at Ultra-low voltages. Specimen courtesy of Dr. Yoshihiro Kamimura,National Institute of Advanced Industrial Science andTechnology (AIST), Japan Left: RHO-type Zeolite particle at low-kV. In order to reveal fine steps structure on surface, the image was acquired […]

Hitachi Focused Ion and Electron Beam System Ethos NX5000 Series (FIB-SEM)

Hitachi Ethos FIB-SEM Features Key Features 1. High-Performance FE-SEM Column with Dual Lens Mode 2. High-Throughput Material Processing 3. Microsampling System 4. Triple-Beam Capable, Delivering Advanced Quality Results 5. Large Multi-Port Chamber and Stage for Various Applications Refined Electron Optics and Multi-Signal Detection The Ethos SEM column is composed of a magnetic- and electrostatic-field compound […]

Hitachi Scanning Electron Microscopes SU3800 / SU3900

Hitachi Scanning Electron Microscopes SU3800 / SU3900 Feature 1.Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples ■Robust Stage for Flexibility in Sample Size, Shape, and Weight ■Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation 2.Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level ■Multiple Modes of Operation ■ Automatic […]

Hitachi TM4000II / TM4000Plus II | Innovative Scanning Electron Microscope Philippines

Tabletop Scanning Electron Microscope Philippines The Hitachi TM4000II and TM4000Plus II Scanning Electron Microscopes (SEM) offer advanced imaging capabilities with user-friendly operation. These tabletop SEMs provide high-resolution images and elemental analysis, making them ideal for research, quality control, and educational applications. Available in the Philippines through Sigmatech Inc. A quality image can be obtained with […]

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