ULVAC PHI GENESIS Fully-automated multi-technique scanning XPS/HAXPES

[Background] Advanced materials such as all-solid-state batteries, advanced semiconductors, and artificial photosynthesis are complex combinations of materials, and their research and development require speed in optimizing the performance of each material as well as the combination of materials. There is a growing need for high-performance and highly functional surface and interface analysis that can dramatically […]

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failure analysis, material characterization, and metrology equipment

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