Inquire
Inquire
Insight KK
Failure Analysis, Material Characterization, Metrology Equipment
Scanning Acoustic Microscope

Scanning Acoustic Microscope

IS-202

IS-202 Scanning Acoustic Microscope insight kk

The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up. It is ideally suited for mid-volume lab applications where high resolution and data acquisition flexibility are crucial to obtain high quality scanning results. Due to its small dimensions this desktop scanner easily fits in every laboratory environment.

Inquire

Insight KK IS-202 Scanning Acoustic Microscope

  • High precision scanning by use of extremely low noise linear servo motor on the scan axis
  • High-speed scanning at up to 500 mm/sec
  • Specific low-vibration data acquisition mode integrated
  • High scan resolution of down to 0.1 µm on all three x-, y-, and z-axis
  • Simultaneous pulse-echo and through transmission acquisition supported
  • Removable water tank for easy cleaning
  • Scan mechanics can be used for other than water immersion techniques
IS-202 Scanning Acoustic Microscope insight kk

Contact us for more information.

Insight kk IS-202 Scanning Acoustic Microscope

More Insight kk Products ➤

Features
  • High precision scanning by use of extremely low noise linear servo motor on the scan axis
  • High-speed scanning at up to 500 mm/sec
  • Specific low-vibration data acquisition mode integrated
  • High scan resolution of down to 0.1 µm on all three x-, y-, and z-axis
  • Simultaneous pulse-echo and through transmission acquisition supported
  • Removable water tank for easy cleaning
  • Scan mechanics can be used for other than water immersion techniques

Insight kk IS-202 Scanning Acoustic Microscope

More Insight kk Products ➤

Related Products

1

NEXTA DSC

Differential Scanning Calorimeter

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
Focused Ion and Electron Beam System Ethos NX5000 Series FIB-SEM
1

NX5000

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.
ulv

Semiconductor Auto Review System

Solution for the review of defects of semiconductor integrated circuit detected by AOI/AVI at front end processing, helps to eliminate false defects and increase overall yield.
ulv

IR-2200

Infrared Microscope

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.
1

MC1000

Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-
ultra tec

Ultrapol Advance

Flat Lapping and Polishing Machine

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.
ArBlade 5000 Ion Milling System
1

ArBlade 5000

Ion Milling System

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.
Hitachi NEXTA STA Simultaneous thermogravimetric analyzer
1

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
Emission Microscope
2

Phemos-X

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
Hitachi SEM SU7000 Scanning Electron Microscope
1

SU7000

Scanning Electron Micrscope

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis
Browse All Products

How can we help?

You may contact our specialists by accomplishing form below.

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

IS-202
Scanning Acoustic Microscope
IS-202
Scanning Acoustic Microscope