This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

srv-300_descp.png

Related Products

The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up.
The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up.
The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens.
The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens.
STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.
ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.
Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.
Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.
Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

Semiconductor Auto Review System
Semiconductor Auto Review System