Seiwa Optical Semiconductor Auto Review System

Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

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PHI nanoTOF ３+

Time-of-Flight Secondary Ion Mass Spectrometry

ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.

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MC1000

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The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

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NEXTA STA Series

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PHI GENESIS

Fully-automated multi-technique scanning XPS/HAXPES

ULVAC-PHI brings essential surface analysis technologies together in an automated platform for advanced battery thin film and interface characterization.

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Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers. By using On-Fly measurement mode, system perform high speed and high accuracy visual inspection for such as pattern defects, contamination, cracks.

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This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.