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Seiwa
Failure Analysis, Material Characterization, Metrology Equipment
Semiconductor Inspection System

Semiconductor Auto Review System

ulv

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

Inquire Now
Add to Quote List
Add to Quote List

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

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Semiconductor Auto Review System
Semiconductor Auto Review System