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Seiwa
Failure Analysis, Material Characterization, Metrology Equipment
Semiconductor Inspection System

Semiconductor Auto Review System

ulv

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

Key Industries: Semiconductor and Electronics and more.
Inquire

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

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Features

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Semiconductor Auto Review System
Semiconductor Auto Review System