This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

srv-300_descp.png

Related Products

Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Real‑time quantitative imaging for life sciences and materials science
Real‑time quantitative imaging for life sciences and materials science
IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.
IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.
Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification
Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification
Built for adaptability and designed to grow, upgrade, and evolve with your research needs.
Built for adaptability and designed to grow, upgrade, and evolve with your research needs.
Measures a wide range of samples, including thin film and small samples.
Measures a wide range of samples, including thin film and small samples.

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

Semiconductor Auto Review System
Semiconductor Auto Review System