Seiwa Optical Semiconductor Auto Review System

Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

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NEXTA STA Series

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.

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iPHEMOS MPX

Inverted Emission Microscope

The iPHEMOS-MPX is a high-resolution Inverted Emission Microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

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SU8600

Ultra High Resolution Cold-FESEM

The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.

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Park Lyncée Transmission Series

Digital Holographic Microscopes

Real‑time quantitative imaging for life sciences and materials science

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PHI nanoTOF ３+

Time-of-Flight Secondary Ion Mass Spectrometry

ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.

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Park Lyncée Reflection Series

Digital Holographic Microscopes

Time-resolved advanced topography solutions

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IR-2200

Infrared Microscope

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

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Park Accurion Vario Series

Modular Isolation Elements

Versatile solution for various applications

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From its inception in 2000, Sigmatech Inc. has been specializing in sales and service of advanced technology laboratory equipment used in broad applications.

We continuously strive to expand our sales and service coverage and provide cost-effective solutions to our customers. Check out events we partake in.

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Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers. By using On-Fly measurement mode, system perform high speed and high accuracy visual inspection for such as pattern defects, contamination, cracks.

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This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.