Seiwa Optical Semiconductor Auto Review System

Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.

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IA30

FTIR Spectrometer

Perfect for everyday analysis, it delivers fast, accurate IR measurements for all applications.

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Park Nano-IR Spectrometers

Research Atomic Force Microscope

AFM-integrated nanoscale IR spectroscopy for advanced material characterization

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NX5000

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.

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iPHEMOS MPX

Inverted Emission Microscope

The iPHEMOS-MPX is a high-resolution Inverted Emission Microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

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Phemos-X

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

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IR-2200

Infrared Microscope

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

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IM4000II

Ion Milling System

Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.

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TMA7000 Series

Thermomechanical Analyzer

Measures a wide range of samples, including thin film and small samples.

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From its inception in 2000, Sigmatech Inc. has been specializing in sales and service of advanced technology laboratory equipment used in broad applications.

We continuously strive to expand our sales and service coverage and provide cost-effective solutions to our customers. Check out events we partake in.

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Semiconductor Auto Review System

This equipment is for automated optical inspection system for semiconductor device wafers. By using On-Fly measurement mode, system perform high speed and high accuracy visual inspection for such as pattern defects, contamination, cracks.

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This equipment is for automated optical inspection system for semiconductor device wafers.
By using On-Fly measurement mode, system perform high speed and high accuracy
visual inspection for such as pattern defects, contamination, cracks.