The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

ZONESEMⅡ Sample Cleaner

ZONESEMⅡ

Designed specifically for Hitachi specimen holders, the ZONESEMⅡ provides optimized sample cleaning and storage modes of operation. The ZONESEMⅡ serves as an excellent desiccator to prevent holder out-gassing.

  • Easy-to-use touchscreen panel
  • Programmable up to 24hrs
  • Variable pressure control

Cause of contamination

Interactions between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface during sample handling, preparation, and storage.

Sample Cleaning Necessary

Cleaning Process

The ZONESEMⅡ uses a UV lamp with wavelengths of 185 nm and 254 nm to efficiently remove hydrocarbons. Ozone is generated from oxygen in the vacuum-controlled specimen chamber, and generated ozone is broken into oxygen and activated oxygen. Hydrocarbons on the specimen surface are broken into volatile molecules such as CO2, H2O by radical oxygen and UV. The exhaust pump evacuates the free molecules from the sample chamber.

Cleaning Process
ZONESEMⅡ Sample Cleaner

For more information, contact us.

See more on Hitachi’s website

 

Hitachi Sample Preparation Equipment available through Sigmatech Inc. Philippines About us

Related Products

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.
The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.
The K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control.
The K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control.
The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.
The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.
Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.
Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.
The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.
The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.
ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.
ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

ZONESEMⅡ​
Sample Cleaner​
ZONESEMⅡ​
Sample Cleaner​