Hitachi Sample Cleaner ZONESEMⅡ - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Sample Preparation

Sample Cleaner

ZONESEMⅡ

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

ZONESEMⅡ Sample Cleaner

ZONESEMⅡ

Designed specifically for Hitachi specimen holders, the ZONESEMⅡ provides optimized sample cleaning and storage modes of operation. The ZONESEMⅡ serves as an excellent desiccator to prevent holder out-gassing.

Easy-to-use touchscreen panel
Programmable up to 24hrs
Variable pressure control

Cause of contamination

Interactions between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface during sample handling, preparation, and storage.

Sample Cleaning Necessary

Cleaning Process

The ZONESEMⅡ uses a UV lamp with wavelengths of 185 nm and 254 nm to efficiently remove hydrocarbons. Ozone is generated from oxygen in the vacuum-controlled specimen chamber, and generated ozone is broken into oxygen and activated oxygen. Hydrocarbons on the specimen surface are broken into volatile molecules such as CO₂, H₂O by radical oxygen and UV. The exhaust pump evacuates the free molecules from the sample chamber.

Cleaning Process

ZONESEMⅡ Sample Cleaner

For more information, contact us.

See more on Hitachi’s website

Hitachi Sample Preparation Equipment available through Sigmatech Inc. Philippines About us

Features

ZONESEMⅡ

Designed specifically for Hitachi specimen holders, the ZONESEMⅡ provides optimized sample cleaning and storage modes of operation. The ZONESEMⅡ serves as an excellent desiccator to prevent holder out-gassing.

Easy-to-use touchscreen panel
Programmable up to 24hrs
Variable pressure control

Cause of contamination

Interactions between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface during sample handling, preparation, and storage.

Cleaning Process

The ZONESEMⅡ uses a UV lamp with wavelengths of 185 nm and 254 nm to efficiently remove hydrocarbons. Ozone is generated from oxygen in the vacuum-controlled specimen chamber, and generated ozone is broken into oxygen and activated oxygen. Hydrocarbons on the specimen surface are broken into volatile molecules such as CO₂, H₂O by radical oxygen and UV. The exhaust pump evacuates the free molecules from the sample chamber.

Downloads

See more on Hitachi’s website

Hitachi Sample Preparation Equipment available through Sigmatech Inc. Philippines About us

Related Products

IR-2200

Infrared Microscope

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

IS 350

Scanning Acoustic Microscope

The Insight-Scan (IS) series of Scanning Acoustic Microscopes(SAM) integrates the finest state-of-the-art technology for high resolution, high speed, fully digital non-destructive sample analysis.

PHI 710

Auger Electron Spectroscopy (AES, SAM)

The only scanning Auger nanoprobe in the world that guarantees a field emission electron source whose spatial resolution is 8 nm or less.

K850

Critical Point Dryer

The K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control.

NX5000

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.

MC1000

Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

Ultraslice Macrotome

Precision Diamond Saw

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

SU7000

Scanning Electron Micrscope

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

SU9000

Ultra-high Resolution Scanning Electron Microscope

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright

TM4000 Plus

Tabletop Scanning Electron Microscope

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design