Park Systems Park NX12 Specialized Atomic Force Microscope

NX12 is a specialized atomic force microscope (AFM) for materials science, electrochemical, and biochemical research. It delivers nanoscale imaging and property characterization in both liquid and ambient environments, integrating scanning probe techniques with inverted optical microscopy for comprehensive analysis of dynamic processes. At its core, NX12 combines Park’s True Non-contact™ mode and an orthogonal scan […]

Park Systems Park NX20 Large Sample Atomic Force Microscope

Park NX20 is a flagship atomic force microscope (AFM) designed for large-sample research, delivering unmatched accuracy, reliability, and ease of use. As Park Systems’ original 200 mm sample AFM, it has earned global recognition in both academic and industrial laboratories for producing precise, repeatable nanoscale measurements.​ At the core of NX20 are Park Systems’ proprietary […]

Park Systems Park NX1 Atomic Force Microscope

Park NX1 is a compact AFM designed for high-resolution imaging with stable operation. The system combines a mechanically rigid structure with a thermally stable body to support atomic-scale imaging in ambient conditions while maintaining the ease of use typical of Park Systems instruments. A minimal mechanical loop between the probe and the sample improves mechanical […]

Park FX200 Large Sample AFM

Park FX200 is Park Systems’ latest innovation in atomic force microscopy (AFM), designed to accommodate samples up to 200 mm. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX200 delivers unmatched precision and reliability. Like all Park AFMs, FX200 features an orthogonal scan system and True Non-contact™ mode, enabling accurate, […]

Park Systems Park NX10 Atomic Force Microscope – Flagship AFM Philippines

Park NX10 Atomic Force Microscope – Sigmatech Inc. – AFM Philippines Park NX10 is a flagship atomic force microscope (AFM) designed for small-sample research, delivering unmatched accuracy, reliability, and ease of use. As Park Systems’ original small-sample AFM, it has earned global recognition in both academic and industrial laboratories for producing precise, repeatable nanoscale measurements. […]

Park Systems Park FX40 – Advanced Atomic Force Microscope Philippines

Atomic Force Microscope Philippines – Sigmatech Inc. Park FX40 is Park Systems’ latest innovation in atomic force microscopy (AFM), designed for high-resolution imaging of small samples. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX40 delivers unmatched precision and reliability. Like all Park AFMs, FX40 features an orthogonal scan system […]

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.