Hitachi Sample Cleaner ZONESEMⅡ - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Sample Preparation

Sample Cleaner

ZONESEMⅡ

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

ZONESEMⅡ Sample Cleaner

ZONESEMⅡ

Designed specifically for Hitachi specimen holders, the ZONESEMⅡ provides optimized sample cleaning and storage modes of operation. The ZONESEMⅡ serves as an excellent desiccator to prevent holder out-gassing.

Easy-to-use touchscreen panel
Programmable up to 24hrs
Variable pressure control

Cause of contamination

Interactions between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface during sample handling, preparation, and storage.

Sample Cleaning Necessary

Cleaning Process

The ZONESEMⅡ uses a UV lamp with wavelengths of 185 nm and 254 nm to efficiently remove hydrocarbons. Ozone is generated from oxygen in the vacuum-controlled specimen chamber, and generated ozone is broken into oxygen and activated oxygen. Hydrocarbons on the specimen surface are broken into volatile molecules such as CO₂, H₂O by radical oxygen and UV. The exhaust pump evacuates the free molecules from the sample chamber.

Cleaning Process

ZONESEMⅡ Sample Cleaner

For more information, contact us.

See more on Hitachi’s website

Hitachi Sample Preparation Equipment available through Sigmatech Inc. Philippines About us

Features

ZONESEMⅡ

Designed specifically for Hitachi specimen holders, the ZONESEMⅡ provides optimized sample cleaning and storage modes of operation. The ZONESEMⅡ serves as an excellent desiccator to prevent holder out-gassing.

Easy-to-use touchscreen panel
Programmable up to 24hrs
Variable pressure control

Cause of contamination

Interactions between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface during sample handling, preparation, and storage.

Cleaning Process

The ZONESEMⅡ uses a UV lamp with wavelengths of 185 nm and 254 nm to efficiently remove hydrocarbons. Ozone is generated from oxygen in the vacuum-controlled specimen chamber, and generated ozone is broken into oxygen and activated oxygen. Hydrocarbons on the specimen surface are broken into volatile molecules such as CO₂, H₂O by radical oxygen and UV. The exhaust pump evacuates the free molecules from the sample chamber.

Downloads

See more on Hitachi’s website

Hitachi Sample Preparation Equipment available through Sigmatech Inc. Philippines About us

Related Products

NX5000

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.

IS 350

Scanning Acoustic Microscope

The Insight-Scan (IS) series of Scanning Acoustic Microscopes(SAM) integrates the finest state-of-the-art technology for high resolution, high speed, fully digital non-destructive sample analysis.

iPHEMOS MPX

Inverted Emission Microscope

The iPHEMOS-MPX is a high-resolution Inverted Emission Microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

SU3800 / SU3900

Scanning Electron Microscope

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.

K850

Critical Point Dryer

The K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control.

Q150

Metal/Carbon Sputtering

With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum coaters are suitable for applications, including high-resolution SEM and FIB-SEM, ensuring precise resu

Hitachi HT7800

Transmission Electron Microscope (TEM)

The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens.

NEXTA DMA

Dynamic Mechanical Analyzer

Hitachi’s DMA is the perfect tool for assessing both stiff and soft samples, while also capturing rapid modulus changes.

TM4000 Plus

Tabletop Scanning Electron Microscope

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design

SU9000

Ultra-high Resolution Scanning Electron Microscope

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright