Seiwa Optical Wafer Inspection System - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Add to Quote List

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Brochure >

Related Products

NEXTA DSC

NEXTA DSC

Differential Scanning Calorimeter

Differential Scanning Calorimeter

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

SU3900 SE/SE Plus and SU3800 SE/SE Plus

SU3900 SE/SE Plus and SU3800 SE/SE Plus

High Resolution Schottky Scanning Electron Microscope

High Resolution Schottky Scanning Electron Microscope

A Combination of High Performance and Versatility.

A Combination of High Performance and Versatility.

Park Accurion SIMON

Park Accurion SIMON

Imaging Spectroscopic Ellipsometry

Imaging Spectroscopic Ellipsometry

Your Entry to Imaging Ellipsometry

Your Entry to Imaging Ellipsometry

Phemos-X

Phemos-X

Emission microscope

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

Vulcan + Range

Vulcan + Range

Handheld LIBS Analyzers

Handheld LIBS Analyzers

Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification

Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification

Park Accurion EP4

Park Accurion EP4

Imaging Spectroscopic Ellipsometry

Imaging Spectroscopic Ellipsometry

Our Latest Generation of Imaging Ellipsometers Combines Ellipsometry and Microscopy

Our Latest Generation of Imaging Ellipsometers Combines Ellipsometry and Microscopy

MC1000

MC1000

Ion Sputter Coater

Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

Ultraslice Macrotome

Ultraslice Macrotome

Precision Diamond Saw

Precision Diamond Saw

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.