Seiwa Optical Wafer Inspection System - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Add to Quote List

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Brochure >

Related Products

Park NX-Hivac

Park NX-Hivac

Specialized Atomic Force Microscope

Specialized Atomic Force Microscope

The ideal choice for failure analysis and air-sensitive materials research

The ideal choice for failure analysis and air-sensitive materials research

Scanning Electron Microscope

Scanning Electron Microscope

FlexSEM 1000 II

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

IS 350

IS 350

Scanning Acoustic Microscope

Scanning Acoustic Microscope

The Insight-Scan (IS) series of Scanning Acoustic Microscopes(SAM) integrates the finest state-of-the-art technology for high resolution, high speed, fully digital non-destructive sample analysis.

The Insight-Scan (IS) series of Scanning Acoustic Microscopes(SAM) integrates the finest state-of-the-art technology for high resolution, high speed, fully digital non-destructive sample analysis.

Park Accurion SIMON

Park Accurion SIMON

Imaging Spectroscopic Ellipsometry

Imaging Spectroscopic Ellipsometry

Your Entry to Imaging Ellipsometry

Your Entry to Imaging Ellipsometry

ASAP-1

ASAP-1

Selected Area Preparation System

Selected Area Preparation System

ASAP-1® has become the standard preparation equipment that engineers involved in disciplines such as failure analysis, yield enhancement and competitive analysis.

ASAP-1® has become the standard preparation equipment that engineers involved in disciplines such as failure analysis, yield enhancement and competitive analysis.

Park Accurion RSE

Park Accurion RSE

Referenced Spectroscopic Ellipsometry

Referenced Spectroscopic Ellipsometry

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces

SU8600

SU8600

Ultra High Resolution Cold-FESEM

Ultra High Resolution Cold-FESEM

The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.

The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.

Park Lyncée Transmission Series

Park Lyncée Transmission Series

Digital Holographic Microscopes

Digital Holographic Microscopes

Real‑time quantitative imaging for life sciences and materials science

Real‑time quantitative imaging for life sciences and materials science