Seiwa Optical Wafer Inspection System - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Add to Quote List

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Brochure >

Related Products

Park Accurion Nano Series

Park Accurion Nano Series

Desktop Isolation Tables

Desktop Isolation Tables

Efficiency meets simplicity

Efficiency meets simplicity

NX5000

NX5000

Focused Ion and Electron Beam System

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.

Hitachi HT7800

Hitachi HT7800

Transmission Electron Microscope (TEM)

Transmission Electron Microscope (TEM)

The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens.

The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens.

IM4000II

IM4000II

Ion Milling System

Ion Milling System

Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.

Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.

Ultrapol Advance

Ultrapol Advance

Flat Lapping and Polishing Machine

Flat Lapping and Polishing Machine

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.

Ultraslice Macrotome

Ultraslice Macrotome

Precision Diamond Saw

Precision Diamond Saw

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

IA30

IA30

FTIR Spectrometer

FTIR Spectrometer

Perfect for everyday analysis, it delivers fast, accurate IR measurements for all applications.

Perfect for everyday analysis, it delivers fast, accurate IR measurements for all applications.

TMA7000 Series

TMA7000 Series

Thermomechanical Analyzer

Thermomechanical Analyzer

Measures a wide range of samples, including thin film and small samples.

Measures a wide range of samples, including thin film and small samples.