Seiwa Optical Wafer Inspection System - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Add to Quote List

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Brochure >

Related Products

Scanning Electron Microscope

Scanning Electron Microscope

FlexSEM 1000 II

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

Wafer Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

Park Accurion RSE

Park Accurion RSE

Referenced Spectroscopic Ellipsometry

Referenced Spectroscopic Ellipsometry

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces

TM4000III / TM4000PlusIII

TM4000III / TM4000PlusIII

Tabletop Microscopes

Tabletop Microscopes

A tabletop microscope for the next generation of scientific leaders.

A tabletop microscope for the next generation of scientific leaders.

ULTRAPOL Basic

ULTRAPOL Basic

Manual Lapping & Polishing Machine

Manual Lapping & Polishing Machine

ULTRAPOL Basic lapping and polishing machine offers the build-quality required for high precision manual polishing of materials for production, research and NAND flash chip-off in digital forensics

ULTRAPOL Basic lapping and polishing machine offers the build-quality required for high precision manual polishing of materials for production, research and NAND flash chip-off in digital forensics

Park NX10

Park NX10

Small Sample Atomic Force Microscope

Small Sample Atomic Force Microscope

Proven performance in nanoscale metrology.

Proven performance in nanoscale metrology.

Park NX-HDM

Park NX-HDM

Industrial Atomic Force Microscope

Industrial Atomic Force Microscope

Industry’s leading automated AFM for high-value wafer metrology solutions

Industry’s leading automated AFM for high-value wafer metrology solutions

Vulcan + Range

Vulcan + Range

Handheld LIBS Analyzers

Handheld LIBS Analyzers

Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification

Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification