Seiwa Optical Wafer Inspection System - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Add to Quote List

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Brochure >

Related Products

Park Lyncée Reflection Series

Park Lyncée Reflection Series

Digital Holographic Microscopes

Digital Holographic Microscopes

Time-resolved advanced topography solutions

Time-resolved advanced topography solutions

SU7000

SU7000

Scanning Electron Micrscope

Scanning Electron Micrscope

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

Scanning Electron Microscope

Scanning Electron Microscope

FlexSEM 1000 II

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

Wafer Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

Park NX15

Park NX15

Large Sample Atomic Force Microscope

Large Sample Atomic Force Microscope

The versatile nanometrology tool for advanced research

The versatile nanometrology tool for advanced research

MC1000

MC1000

Ion Sputter Coater

Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM) designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-

TM4000III / TM4000PlusIII

TM4000III / TM4000PlusIII

Tabletop Microscopes

Tabletop Microscopes

A tabletop microscope for the next generation of scientific leaders.

A tabletop microscope for the next generation of scientific leaders.

Vulcan + Range

Vulcan + Range

Handheld LIBS Analyzers

Handheld LIBS Analyzers

Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification

Portable LIBS Analyzers for One-Second Metal Alloy Identification and Material Verification