Seiwa Optical Wafer Inspection System - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Add to Quote List

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Brochure >

Related Products

Park Lyncée Transmission Series

Park Lyncée Transmission Series

Digital Holographic Microscopes

Digital Holographic Microscopes

Real‑time quantitative imaging for life sciences and materials science

Real‑time quantitative imaging for life sciences and materials science

NEXTA DSC

NEXTA DSC

Differential Scanning Calorimeter

Differential Scanning Calorimeter

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

nanoTOF II

nanoTOF II

Time-of-flight Secondary Ion Mass Spectroscope (TOF-SIMS)

Time-of-flight Secondary Ion Mass Spectroscope (TOF-SIMS)

PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features

PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features

ULTRAPOL Basic

ULTRAPOL Basic

Manual Lapping & Polishing Machine

Manual Lapping & Polishing Machine

ULTRAPOL Basic lapping and polishing machine offers the build-quality required for high precision manual polishing of materials for production, research and NAND flash chip-off in digital forensics

ULTRAPOL Basic lapping and polishing machine offers the build-quality required for high precision manual polishing of materials for production, research and NAND flash chip-off in digital forensics

Phemos-X

Phemos-X

Emission microscope

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

RM5

RM5

Raman Microscope

Raman Microscope

Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.

Compact and fully automated, designed for high-performance confocal Raman imaging. Experience intuitive use with advanced spectral precision.

Park Accurion RSE

Park Accurion RSE

Referenced Spectroscopic Ellipsometry

Referenced Spectroscopic Ellipsometry

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces

Park NX-PTR

Park NX-PTR

Industrial Atomic Force Microscope

Industrial Atomic Force Microscope

Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders

Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders