Seiwa Optical Wafer Inspection System - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Semiconductor Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

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Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

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Wafer Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

PHI GENESIS

PHI GENESIS

Fully-automated multi-technique scanning XPS/HAXPES

Fully-automated multi-technique scanning XPS/HAXPES

ULVAC-PHI brings essential surface analysis technologies together in an automated platform for advanced battery thin film and interface characterization.

ULVAC-PHI brings essential surface analysis technologies together in an automated platform for advanced battery thin film and interface characterization.

Phemos-X

Phemos-X

Emission microscope

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

Park Accurion EP4

Park Accurion EP4

Imaging Spectroscopic Ellipsometry

Imaging Spectroscopic Ellipsometry

Our Latest Generation of Imaging Ellipsometers Combines Ellipsometry and Microscopy

Our Latest Generation of Imaging Ellipsometers Combines Ellipsometry and Microscopy

Park NX20

Park NX20

Large Sample Atomic Force Microscope

Large Sample Atomic Force Microscope

The leading nanometrology tool for failure analysis and large sample research

The leading nanometrology tool for failure analysis and large sample research

IA30

IA30

FTIR Spectrometer

FTIR Spectrometer

Perfect for everyday analysis, it delivers fast, accurate IR measurements for all applications.

Perfect for everyday analysis, it delivers fast, accurate IR measurements for all applications.

IM4000II

IM4000II

Ion Milling System

Ion Milling System

Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.

Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.

Scanning Electron Microscope

Scanning Electron Microscope

FlexSEM 1000 II

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.