Seiwa Optical Wafer Inspection System

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

Key Industries: Semiconductor and Electronics and more.

Seiwa Wafer inspection system visually inspects the defect location detected from AOI systems. By importing the inspection system data results from the AOL, this review system is able to capture the visual data and add it to previous inspection results.

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Scanning Electron Microscope

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

SU7000

Scanning Electron Micrscope

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

Wafer Inspection System

Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.

IR-2200

Infrared Microscope

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ArBlade 5000

Ion Milling System

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.

Semiconductor Auto Review System

Solution for the review of defects of semiconductor integrated circuit detected by AOI/AVI at front end processing, helps to eliminate false defects and increase overall yield.