ULTRA TEC Ultraslice Macrotome Precision Diamond Saw - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Sample Preparation

Precision Diamond Saw

Ultraslice Macrotome

LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS, DEVICES & INDUSTRY SAMPLES

Suits Low Budgets
Manual Crank Table Feed, with motor option
Z-Spindle Option adds easy ability to adapt to sample height
Chip-Off for Digital Forensics
Fish & Game Samples
Industrial Samples

LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS, DEVICES & INDUSTRY SAMPLES

Suits Low Budgets
Manual Crank Table Feed, with motor option
Z-Spindle Option adds easy ability to adapt to sample height
Chip-Off for Digital Forensics
Fish & Game Samples
Industrial Samples

Add to Quote List

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw | LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS & DEVICES

ULTRASLICE Macrotome precision diamond saw has a quiet, safe, direct drive design for smooth, chatter free slicing system for important and fragile industrial samples. The system is perfect for the sectioning of cellphone devices and components to allow for downstream chip-off techniques with our milling and polishing equipment. MACROTOME suits many other industrial applications. If you have such an “other” application, talk to us about it and we can confirm suitability – perhaps by cutting samples. Macrotome may represent a low cost solution for you. The wheel (spindle) rotation is variable speed, to allow for optimized cut quality. An easy access coolant reservoir, allows for efficient coolant changes.

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw

For quotation and more info, contact us.

Product Brochure

Related Products

K850

K850

Critical Point Dryer

Critical Point Dryer

The K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control.

The K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control.

ArBlade 5000

ArBlade 5000

Ion Milling System

Ion Milling System

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.

TM4000 Plus

TM4000 Plus

Tabletop Scanning Electron Microscope

Tabletop Scanning Electron Microscope

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design

IR-2200

IR-2200

Infrared Microscope

Infrared Microscope

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision.

Q150

Q150

Metal/Carbon Sputtering

Metal/Carbon Sputtering

With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum coaters are suitable for applications, including high-resolution SEM and FIB-SEM, ensuring precise resu

With options for both oxidizing and non-oxidizing metals, as well as carbon evaporation, Quorum coaters are suitable for applications, including high-resolution SEM and FIB-SEM, ensuring precise resu

Ultrapol Advance

Ultrapol Advance

Flat Lapping and Polishing Machine

Flat Lapping and Polishing Machine

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.

nanoTOF II

nanoTOF II

Time-of-flight Secondary Ion Mass Spectroscope (TOF-SIMS)

Time-of-flight Secondary Ion Mass Spectroscope (TOF-SIMS)

PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features

PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features

SU7000

SU7000

Scanning Electron Micrscope

Scanning Electron Micrscope

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis