NX12 is a specialized atomic force microscope (AFM) for materials science, electrochemical, and biochemical research. It delivers nanoscale imaging and property characterization in both liquid and ambient environments, integrating scanning probe techniques with inverted optical microscopy for comprehensive analysis of dynamic processes.
At its core, NX12 combines Park’s True Non-contact™ mode and an orthogonal scan system with nanopipette-based techniques, enabling precise topography and correlative measurements that connect structural, mechanical, electrical, and optical information on the same sample.
NX12 supports a variety of specialized experiments, including non-invasive in-liquid imaging of live cells with SICM and high-resolution mapping of local reactivity with SECM/SECCM. Its digitally controlled environmental chamber maintains stable gas and temperature conditions for reliable, reproducible research.
Key Features
Integration with Inverted Optical Microscopy
NX12 provides a seamless integration with inverted optical microscopy, offering researchers the ability to combine the large field-of-view of optical imaging with the nanoscale resolution of AFM. This correlative setup makes it possible to analyze samples across multiple length scales in a single workflow. It is particularly valuable for transparent samples and biological research, where both cellular-level structures and nanoscale details must be studied together.
Fast Z Servo and High Resolution
The resolution of the images in Park NX series has been further enhanced. The NX Z scanner, built with a stacked piezo actuator and a strain gauge sensor, delivers fast and precise measurements across a wide range of surfaces. From extremely flat to rough samples, it maintains consistent roughness linearity regardless of scan size, ensuring reliable results in any measurement.
NX Laser Beam Path
The NX head integrates a superluminescent diode that provides low coherence illumination, minimizing interference for stable signal detection. The laser beam is guided through precision mirrors to the cantilever and position-sensitive photodetector (PSPD), ensuring accurate signal alignment.
The knobs move the laser beam directly along the X and Y axes, allowing intuitive adjustment of the beam position and effortless realignment during probe replacement.
Improved Z Scan Straightness
Park NX series Z scanner maintains straightness within 0.1% across the usable range, with out-of-axis motion under 5 nm even at a full 15 µm extension.
Its compact assembly, combining a preload spring, kinematic pin, and piezo actuator, minimizes drift and ensures accurate vertical motion for reliable, distortion-free nanoscale measurements.
Nanopipette-Based Applications
NX12 is not limited to conventional AFM imaging. It also supports advanced applications such as SICM, SICM-SECM, and SECCM. These techniques allow nanoscale electrochemical and ionic imaging, giving researchers powerful tools to explore new areas. With these applications, users can go beyond surface topography to investigate ion-related processes, electrochemical activity, and surface reactivity. This makes the NX12 a versatile platform, suitable not only for materials science but also for biological and electrochemical research.
Nanopipette-Based Scanning Probe Microscopy
SICM — Measures surface topography of soft, liquid-immersed or biological samples by monitoring ionic current through a nanopipette in liquid environments.
SICM-SECM — Enables simultaneous mapping of surface topography and local electrochemical activity in liquid environments.
SECCM — Analyzes localized electrochemical reactions through a nanopipette meniscus without immersing the entire sample in liquid.
Park AFM Technology
Orthogonal Scan System
Conventional AFMs with tube scanners suffer from out-of-plane motion and axes crosstalk, resulting in image distortion, especially over large scan areas. NX12, like all Park AFMs, employs an advanced orthogonal scan system featuring a flexure-guided architecture: a 2D flexure scanner moves the sample in the XY plane, while a separate 1D flexure scanner independently controls the probe’s Z-axis motion. Equipped with low-noise optical sensors for XY feedback and an ultra-low-noise strain gauge sensor for Z control, this separated scanner system ensures highly orthogonal, linear scans with minimal out-of-plane motion and fast dynamic performance.
The XY scanner is designed to achieve flat, purely horizontal motion without vertical interference by using stacked piezo actuators and flexure hinge structures. A position sensor provides direct feedback for servo control, minimizing positioning errors across the scan area. This design ensures consistent accuracy and stability, even when scanning large samples.
Park AFM Technology
True Non-Contact™ Mode
NX12 features True Non-contact™ mode, a proprietary technology exclusively offered by Park Systems. True Non-contact mode obtains topography by detecting the attractive van der Waals force between the AFM tip and the sample surface.
