LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS, DEVICES & INDUSTRY SAMPLES

  • Suits Low Budgets
  • Manual Crank Table Feed, with motor option
  • Z-Spindle Option adds easy ability to adapt to sample height
  • Chip-Off for Digital Forensics
  • Fish & Game Samples
  • Industrial Samples

LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS, DEVICES & INDUSTRY SAMPLES

  • Suits Low Budgets
  • Manual Crank Table Feed, with motor option
  • Z-Spindle Option adds easy ability to adapt to sample height
  • Chip-Off for Digital Forensics
  • Fish & Game Samples
  • Industrial Samples

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw | LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS & DEVICES

ULTRASLICE Macrotome precision diamond saw has a quiet, safe, direct drive design for smooth, chatter free slicing system for important and fragile industrial samples. The system is perfect for the sectioning of cellphone devices and components to allow for downstream chip-off techniques with our milling and polishing equipment. MACROTOME suits many other industrial applications.  If you have such an “other” application, talk to us about it and we can confirm suitability – perhaps by cutting samples.  Macrotome may represent a low cost solution for you. The wheel (spindle) rotation is variable speed, to allow for optimized cut quality. An easy access coolant reservoir, allows for efficient coolant changes.

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw

For quotation and more info, contact us.

Product Brochure

Related Products

ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.
ULTRAPOL Advance has been designed to be an all-in-one lapping & polishing workstation for the production of flat surfaces.
Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.
Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright
The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.
The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.
Solution for the review of defects of semiconductor integrated circuit detected by AOI/AVI at front end processing, helps to eliminate false defects and increase overall yield.
Solution for the review of defects of semiconductor integrated circuit detected by AOI/AVI at front end processing, helps to eliminate false defects and increase overall yield.
The Quorum K975X Turbo-Pumped Thermal Evaporator is a high vacuum evaporator for TEM, SEM and thin film applications.
The Quorum K975X Turbo-Pumped Thermal Evaporator is a high vacuum evaporator for TEM, SEM and thin film applications.
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling.
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling.
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

Ultraslice Macrotome
Precision Diamond Saw
Ultraslice Macrotome
Precision Diamond Saw