Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

The AFM100 Series is Hitachi’s next generation probe microscopy platform. The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy, while providing an easy-to-use platform suitable for users of all experience levels.
Experience the finest reliability and innovation with the AFM100 Series.

The AFM100 Series is Hitachi’s next generation probe microscopy platform. The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy, while providing an easy-to-use platform suitable for users of all experience levels.
Experience the finest reliability and innovation with the AFM100 Series.

Add to Quote List

Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

Pre-mounted cantilevers make replacement EASY(option)

Automated measurement & analysis with one-click autopilot function

Correlative SEM-EDS Analysis with our AFM Marking Function

Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!

Automated AFM Marking Features with Navigation Software.

・Automated AFM Marking Features with Navigation Software. — ※SÆMic. is a generic term for SEM-AFM correlative analysis recommended by Hitachi High-Tech.

[Evaluating AFM-KFM-SEM-EDS of Aluminum Alloy before and after Corrosion]

Specifications

	AFM100 Plus	AFM100
Detection System/Light Source	Optical lever/SLD (Super luminescent diode)
Lever holder	Premount holder^, multi-holder^
Basic Specifications	RMS noise level: ≦0.03 nm, in-plane drift: ≦0.03 nm/sec
Sample size	Max. 35 mmφ, thickness 10 mm, (max. 50 mm sq., thickness 20 mm)^*
Scanner (Scan range)^*	(XY:20 μm/Z:1.5 μm, XY:100 μm/Z:15 μm, XY:150 μm/Z:5 μm)^*(Included with a 5-year warranty)
Light microscope	Microscope with zoom function (Field of view XY:1.8 x 1.38 to 0.26 x 0.2 mm)^* Simple optical microscope (Field of view XY:1.6 x 1.2 mm)^*	Simple optical microscope (field of view XY:1.6 × 1.2 mm)
Basic functions	AFM, DFM, PM, FFM, SIS-shapes/properties, Q-value control	AFM, DFM, PM, FFM, SIS-shapes
Vibration isolation and noise isolation mechanism	Passive vibration isolation air table and sound-proof cover	Standard tabletop
Sample transfer mechanism	Manual Stage XY:±2.5 mm, Impact Stage Set (Conductive Type)^*
Measurement environment	Atmosphere, in liquid^, heated^ (room temperature to 250 °C), heated in liquid^* (room temperature to 60 °C)
Other functions	Self-check function, software download service, AFM marking^*
Power Supply Specifications	AC 100 V ± 10 V, 15 A, 1 line, D inoculated grounded receptacle

※The asterisk (*) in the table indicates feature is optional.

※For detailed specifications, please refer to the product specification sheet.

Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

For more information, contact us. See more on Hitachi’s website

IS-202

Scanning Acoustic Microscope

The IS-202 Scanning Acoustic Microscope combines highest resolution with a very compact mechanical set-up.

Add to Quote

NX5000

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.

Add to Quote

ASAP-1

Selected Area Preparation System

ASAP-1® has become the standard preparation equipment that engineers involved in disciplines such as failure analysis, yield enhancement and competitive analysis.

Add to Quote

ZONESEMⅡ

Sample Cleaner

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

Add to Quote

SU9000

Ultra-high Resolution Scanning Electron Microscope

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright

Add to Quote

Scanning Electron Microscope

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

Add to Quote

Phemos-X

Emission microscope

The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

Add to Quote