Spectrophotometers (UV-Vis/NIR/FL)

U-5100

Ratio Beam Spectrophotometer

UH5300​

Double Beam Spectrophotometer​

U-2900/2910

Double Beam Spectrophotometer

U-3900/3900H

Spectrophotometer

UH4150

UV-Visible/NIR Spectrophotometer

F-2700​

Fluorescence Spectrophotometer​

F-7000

Fluorescence Spectrophotometer

F-7100

Fluorescence Spectrophotometer

HPLC AND AAA

ChromasterUltra Rs

Ultra High Performance Liquid Chromatographs (UHPLC)

Chromaster

High Performance Liquid Chromatographs (HPLC)

Chromaster® 5610 MS Detector

High Performance Liquid Chromatographs (HPLC)

Primaide

High Performance Liquid Chromatographs (HPLC)

LA8080 AminoSAAYA

High-Speed Amino Acid Analyzer

Thermal Analysis

DMA7100​

Dynamic Mechanical Analyzer​

TMA7000 Series​

Thermomechanical Analyzer​

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer​

NEXTA® DSC series​

Differential Scanning Calorimeter (DSC)​

Atomic Absorption Spectrophotometers (AAS)

ZA3000 Series

Polarized Zeeman Atomic Absorption Spectrophotometer

Electron Microscopes (SEM/TEM/STEM)

SU9000

Ultra-high Resolution Scanning Electron Microscope

Regulus Series​

Ultra-high Resolution Scanning Electron Microscope​

SU7000​

Ultra-High-Resolution Schottky Scanning Electron​

SU5000​

Schottky Field Emission Scanning Electron Microscope​

SU3800/SU3900​

Scanning Electron Microscopes​

FlexSEM 1000 II​

Scanning Electron Microscope​

TM4000II / TM4000Plus II

Tabletop Microscopes

HF5000​

Field Emission Transmission Electron Microscope​

HD-2700​

Spherical Aberration Corrected STEM/SEM​

HT7800 Series​

Transmission Electron Microscope

NE4000​

Electron Beam Absorbed Current (EBAC) Characterization System nanoEBAC​

NP6800​

Nanoscale Device Characteristics Analysis System Nano-Prober​

NX2000​

Focused Ion and Electron Beam System & Triple Beam System​

NX9000​

Real-time 3D analytical FIB-SEM​

NX5000​

Focused Ion and Electron Beam System Ethos​

H-9500​

Transmission Electron Microscope​

Atomic Force Microscopes

AFM5100N​

General-purpose Small Unit​

AFM5300E

Environmental Control Unit​

AFM5500M ​

Mid-sized Probe Microscope System ​

Sample Preparation

ArBlade 5000

Ion Milling System

IM4000Plus​

Ion Milling System​

ZONETEMⅡ​

Sample Cleaner​

MC1000

Ion Sputter Coater​

ZONESEMⅡ​

Sample Cleaner​

  • Analytical Systems
  • Electron Microscopes
  • Atomic Force Microscope
  • Sample Preparation

Spectrophotometers (UV-Vis/NIR/FL)

U-5100

Ratio Beam Spectrophotometer

UH5300​

Double Beam Spectrophotometer​

U-2900/2910

Double Beam Spectrophotometer

U-3900/3900H

Spectrophotometer

UH4150

UV-Visible/NIR Spectrophotometer

F-2700​

Fluorescence Spectrophotometer​

F-7000

Fluorescence Spectrophotometer

F-7100

Fluorescence Spectrophotometer

High Performance Liquid Chromatographs (HPLC) and Amino Acid Analyzers (AAA)

ChromasterUltra Rs

Ultra High Performance Liquid Chromatographs (UHPLC)

Chromaster

High Performance Liquid Chromatographs (HPLC)

Chromaster® 5610 MS Detector

High Performance Liquid Chromatographs (HPLC)

Primaide

High Performance Liquid Chromatographs (HPLC)

LA8080 AminoSAAYA

High-Speed Amino Acid Analyzer

Thermal Analysis

DMA7100​

Dynamic Mechanical Analyzer​

TMA7000 Series​

Thermomechanical Analyzer​

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer​

NEXTA® DSC series​

Differential Scanning Calorimeter (DSC)​

Atomic Absorption Spectrophotometers (AAS)

ZA3000 Series

Polarized Zeeman Atomic Absorption Spectrophotometer

FE-SEM (Field Emission Scanning Electron Microscopes)

SU9000

Ultra-high Resolution Scanning Electron Microscope

Regulus Series​

Ultra-high Resolution Scanning Electron Microscope​

SU7000​

Ultra-High-Resolution Schottky Scanning Electron​

SU5000​

Schottky Field Emission Scanning Electron Microscope​

SEM (Scanning Electron Microscopes)

SU3800/SU3900​

Scanning Electron Microscopes​

FlexSEM 1000 II​

Scanning Electron Microscope​

Tabletop Microscopes

TM4000II / TM4000Plus II

Tabletop Microscopes

TEM (Transmission Electron Microscopes)

HF5000​

Field Emission Transmission Electron Microscope​

HD-2700​

Spherical Aberration Corrected STEM/SEM​

HT7800 Series​

Transmission Electron Microscope

H-9500​

Transmission Electron Microscope​

Nano-probing System

NE4000​

Electron Beam Absorbed Current (EBAC) Characterization System nanoEBAC​

NP6800​

Nanoscale Device Characteristics Analysis System Nano-Prober​

Focused Ion Beam Systems (FIB/FIB-SEM)

NX2000​

Focused Ion and Electron Beam System & Triple Beam System​

NX9000​

Real-time 3D analytical FIB-SEM​

NX5000​

Focused Ion and Electron Beam System Ethos​

AFM5100N​

General-purpose Small Unit​

AFM5300E

Environmental Control Unit​

AFM5500M ​

Mid-sized Probe Microscope System ​

ArBlade 5000

Ion Milling System

IM4000Plus​

Ion Milling System​

ZONETEMⅡ​

Sample Cleaner​

MC1000

Ion Sputter Coater​

ZONESEMⅡ​

Sample Cleaner​

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