uh5700 spectrophotometer

UH5700

UV-Visible/NIR Spectrophotometer

Opening the way to the future, the UH5700, the spectroscopy specialist, handles the ultraviolet, visible, and near-infrared regions and strongly supports you...

Polarized Zeeman Atomic Absorption Spectrophotometer ZA3000

ZA3000 Series

Polarized Zeeman Atomic Absorption Spectrophotometer

ZA3000 series developed to meet user’s needs is a new elemental analysis instrument which employs the technology unachievable by other atomic absorption spectrophotometers so as to enhance the functionality and reliability while preserving the basic performance

su9000 Scanning Electron Microscope

SU9000

Ultra-high Resolution Scanning Electron Microscope

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate Scanning Electron Microscope with superior beam brightness and stability, affording high-resolution imaging and high-quality elemental analysis.

Hitachi FE-SEM Regulus Series​

Regulus Series​

Ultra-high Resolution Scanning Electron Microscope​

As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform.

Hitachi Schottky FE-SEM SU7000

SU7000​

Ultra-High-Resolution Schottky Scanning Electron​

This modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.

Hitachi Schottky FE-SEM SU5000​

SU5000​

Schottky Field Emission Scanning Electron Microscope​

Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes.

Hitachi Scanning Electron Microscopes SU3800/SU3900

SU3800/SU3900​

Scanning Electron Microscopes​

Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.

Hitachi FlexSEM 1000 II​

FlexSEM 1000 II​

Scanning Electron Microscope​

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

Hitachi Tabletop Microscopes

TM4000II / TM4000Plus II

Tabletop Microscopes

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products.

Hitachi HF5000

HF5000​

Field Emission Transmission Electron Microscope​

The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi's own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series.

Hitachi STEM/SEM HD-2700

HD-2700​

Spherical Aberration Corrected STEM/SEM​

The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously.

ht7800

HT7800 Series​

Transmission Electron Microscope

The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high resolution.

nanoEBAC​ System NE4000​

NE4000​

Electron Beam Absorbed Current (EBAC) Characterization System nanoEBAC​

The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC analysis and imaging of microelectronic device interconnects, materials, and components.​

np6800

NP6800​

Nanoscale Device Characteristics Analysis System Nano-Prober​

The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond.

Hitachi Ion Milling System ArBlade 5000

ArBlade 5000

Ion Milling System

The most advanced broad ion milling system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.​

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