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Hitachi High-Tech

Electron Microscopes
Analytical Equipment
Thermal Analysis
Sample Preparation
Electron Microscopes
Hitachi Scanning Electron Microscope Flexsem

Scanning Electron Microscope

FlexSEM 1000 II

Transmission Electron Microscope Philippines

Hitachi HT7800

Transmission Electron Microscope (TEM)

Hitachi SEM SU7000 Scanning Electron Microscope

SU7000

Scanning Electron Micrscope

Hitachi SU9000 Scanning Electron Microscope SEM

SU9000

Ultra-high Resolution Scanning Electron Microscope

SU8600

Ultra High Resolution Cold-FESEM

Focused Ion and Electron Beam System Ethos NX5000 Series FIB-SEM

NX5000

Focused Ion and Electron Beam System

su3900 Scanning Electron Microscope

SU3800 / SU3900

Scanning Electron Microscope

Hitachi Atomic Force Microscope AFM100 Multifunctional Probe Microscopy Platform

AFM100

Multifunctional Probe Atomic Force Microscope

Tabletop Scanning Electron Microscope Philippines

TM4000 Plus

Tabletop Scanning Electron Microscope

Analytical Instruments
Hitachi Ratio Beam Spectrophotometer U-5100

U-5100

Ratio Beam Spectrophotometer

Hitachi Double Beam Spectrophotometer​ UH5300​

UH5300​

Double Beam Spectrophotometer​

Hitachi Double Beam Spectrophotometer u2900

U-2900/2910

Double Beam Spectrophotometer

UH4150

UV-Visible/NIR Spectrophotometer

Hitachi Fluorescence Spectrophotometer F-7100

F-7100

Fluorescence Spectrophotometer

ChromasterUltraRs HPLC UHPLC Sigmatech Inc Philippines

ChromasterUltra Rs

Ultra High Performance Liquid Chromatographs (UHPLC)

LA8080 AminoSAAYA

High-Speed Amino Acid Analyzer

Chromaster

HPLC

Hitachi Primaide HPLC Primaide Philippines

Primaide

High Performance Liquid Chromatograph (HPLC)

HPLC chromaster

HPLC Chromaster

High-Performance Liquid Chromatograph

Thermal Analysis
Hitachi NEXTA DMA Dynamic Mechanical Analyzer Philippines

NEXTA DMA

Dynamic Mechanical Analyzer

NEXTA DSC

Differential Scanning Calorimeter

Hitachi NEXTA STA Simultaneous thermogravimetric analyzer

NEXTA STA Series

Simultaneous Thermogravimetric Analyzer (DSC-TGA)

Sample Preparation
ZONESEMⅡ Sample Cleaner

ZONESEMⅡ​

Sample Cleaner​

MC1000

Ion Sputter Coater

HITACHI IM4000 Ion Milling System

IM4000Plus

Ion Milling System

ArBlade 5000 Ion Milling System

ArBlade 5000

Ion Milling System

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failure analysis, material characterization, and metrology equipment

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